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Dimensional Quantification of Embedded Voids or Objects in Three Dimensions Using X-Ray Tomography
Patterson, Brian M., Escobedo-Diaz, Juan P., Dennis-Koller, Darcie, Cerreta, EllenVolume:
18
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927611012554
Date:
April, 2012
File:
PDF, 789 KB
english, 2012