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[IEEE 2016 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2016.3.13-2016.3.14)] 2016 China Semiconductor Technology International Conference (CSTIC) - Measurement of direct current and high frequency electrical characteristics for Through-Silicon-Via
Li, Cheng, Guo, Han, Liu, Ziyu, Wang, Qian, Cai, JianYear:
2016
Language:
english
DOI:
10.1109/CSTIC.2016.7463945
File:
PDF, 475 KB
english, 2016