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Pamam built-on-silicon wafer thin-layer extraction devices for selective metal contamination detection
Valdés, Oscar, Vergara, Claudia, Nachtigall, Fabiane M., Lopez-Cabaña, Zoraya, Tapia, Jaime, Santos, Leonardo S.Volume:
57
Language:
english
Journal:
Tetrahedron Letters
DOI:
10.1016/j.tetlet.2016.04.063
Date:
June, 2016
File:
PDF, 1.50 MB
english, 2016