Development of a STEM-EBIC/CL System for Structural,...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

Development of a STEM-EBIC/CL System for Structural, Compositional, Electrical, and Optical Characterization of Quantum Well Devices

Bunker, K.L., Garcia, R., Russell, P.E.
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927604882679
Date:
August, 2004
File:
PDF, 299 KB
english, 2004
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