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SPIE Proceedings [SPIE 1985 International Technical Symposium/Europe - Cannes, France (Monday 25 November 1985)] Infrared Technology and Applications - Observed Differences In MTF Results Between Line-Spread And Interferometric Measurements For IR Lenses
Jennings, J. Peter, Busselle, F. J. Buzz, Shaw, Steven G., Baker, Lionel R., Masson, AndreVolume:
590
Year:
1986
Language:
english
DOI:
10.1117/12.951976
File:
PDF, 1.41 MB
english, 1986