An induction machine and power electronic test system on a field-programmable gate array
Dufour, Christian, Cense, Sébastien, Bélanger, JeanLanguage:
english
Journal:
Mathematics and Computers in Simulation
DOI:
10.1016/j.matcom.2016.03.014
Date:
May, 2016
File:
PDF, 1.24 MB
english, 2016