Thickness identification of epitaxial Bi 2...

2D Materials 2016 / 05 Vol. 3; Iss. 2

Thickness identification of epitaxial Bi 2 Te 3 via optical contrast

Vajner, Cooper, Yan, Haoming, Guo, Lingling, Mathews, Melissa, Kuhlman, Michael, Benefield, Shellby, Ulrich, Steven, Zolghadr, Ehsan, Kung, Patrick, Li, Lin, Araujo, Paulo T, Wang, Hung-Ta
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Volume:
3
Language:
english
Journal:
2D Materials
DOI:
10.1088/2053-1583/3/2/021010
Date:
May, 2016
File:
PDF, 1.93 MB
english, 2016
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