[IEEE 2016 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2016.3.13-2016.3.14)] 2016 China Semiconductor Technology International Conference (CSTIC) - Corner SRAF study for CT DOF enhancement in 28NM technology node
Jiang, Bin-Jie, Chen, Yan-Peng, Yu, Shi-Rui, Mao, Zhi-BiaoYear:
2016
Language:
english
DOI:
10.1109/CSTIC.2016.7463977
File:
PDF, 562 KB
english, 2016