[IEEE 2016 China Semiconductor Technology International...

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[IEEE 2016 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2016.3.13-2016.3.14)] 2016 China Semiconductor Technology International Conference (CSTIC) - Corner SRAF study for CT DOF enhancement in 28NM technology node

Jiang, Bin-Jie, Chen, Yan-Peng, Yu, Shi-Rui, Mao, Zhi-Biao
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Year:
2016
Language:
english
DOI:
10.1109/CSTIC.2016.7463977
File:
PDF, 562 KB
english, 2016
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