Reliability simulation for analog ICs: Goals, solutions, and challenges
Toro-Frías, A., Martín-Lloret, P., Martin-Martinez, J., Castro-López, R., Roca, E., Rodriguez, R., Nafria, M., Fernández, F.V.Language:
english
Journal:
Integration, the VLSI Journal
DOI:
10.1016/j.vlsi.2016.05.002
Date:
May, 2016
File:
PDF, 1.43 MB
english, 2016