Reliability simulation for analog ICs: Goals, solutions,...

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Reliability simulation for analog ICs: Goals, solutions, and challenges

Toro-Frías, A., Martín-Lloret, P., Martin-Martinez, J., Castro-López, R., Roca, E., Rodriguez, R., Nafria, M., Fernández, F.V.
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Language:
english
Journal:
Integration, the VLSI Journal
DOI:
10.1016/j.vlsi.2016.05.002
Date:
May, 2016
File:
PDF, 1.43 MB
english, 2016
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