[IEEE 2016 Pan Pacific Microelectronics Symposium (Pan Pacific) - Big Island, HI, USA (2016.1.25-2016.1.28)] 2016 Pan Pacific Microelectronics Symposium (Pan Pacific) - Comprehensive correlation of inline inspection data for the evaluation of defects in heterogeneous electronic assemblies
Harter, Stefan, Klinger, Tobias, Franke, Jorg, Beer, DetlefYear:
2016
Language:
english
DOI:
10.1109/PanPacific.2016.7428408
File:
PDF, 1.47 MB
english, 2016