SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, United States (Sunday 22 January 2012)] Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII - Diffusion dark current in front-illuminated CCDs and CMOS image sensors
Widenhorn, Ralf, Blouke, M. M., Nguyen, Valérie, Dupret, AntoineVolume:
8298
Year:
2012
Language:
english
DOI:
10.1117/12.920463
File:
PDF, 520 KB
english, 2012