Conductive-probe atomic force microscopy characterization...

Nanoscale Research Letters 2011 / 12 Vol. 6; Iss. 1

Conductive-probe atomic force microscopy characterization of silicon nanowire

José Alvarez, Irène Ngo, Marie-Estelle Gueunier-Farret, Jean-Paul Kleider, Linwei Yu, Pere Rocai Cabarrocas, Simon Perraud, Emmanuelle Rouvière, Caroline Celle, Céline Mouchet, Jean-Pierre Simonato
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Volume:
6
Language:
english
DOI:
10.1186/1556-276x-6-110
Date:
December, 2011
File:
PDF, 3.01 MB
english, 2011
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