Nanoscale characterization of electrical transport at...

Nanoscale Research Letters 2011 / 12 Vol. 6; Iss. 1

Nanoscale characterization of electrical transport at metal/3C-SiC interfaces

Jens Eriksson, Fabrizio Roccaforte, Sergey Reshanov, Stefano Leone, Filippo Giannazzo, Raffaella LoNigro, Patrick Fiorenza, Vito Raineri
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Volume:
6
Language:
english
DOI:
10.1186/1556-276x-6-120
Date:
December, 2011
File:
PDF, 692 KB
english, 2011
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