![](/img/cover-not-exists.png)
Convergent-Beam Low Energy Electron Diffraction (CBLEED) and the Measurement of Surface Dipole Layers
Spence, J.C.H., Poon, H.C., Saldin, D.K.Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927604040346
Date:
February, 2004
File:
PDF, 556 KB
english, 2004