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Use of Monte Carlo Modeling to Aid Interpretation and Quantification of the Low Energy-Loss Electron Yield at Low Primary Energies
Bonet, Christopher, Pratt, Andrew, El-Gomati, Mohamed M., Matthew, Jim A.D., Tear, Steven P.Volume:
14
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927608080719
Date:
October, 2008
File:
PDF, 375 KB
english, 2008