Strain Measurement in Semiconductor Heterostructures by...

Microscopy and Microanalysis 2012 / 10 Vol. 18; Iss. 5

Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy

Müller, Knut, Rosenauer, Andreas, Schowalter, Marco, Zweck, Josef, Fritz, Rafael, Volz, Kerstin
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Volume:
18
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927612001274
Date:
October, 2012
File:
PDF, 1.03 MB
english, 2012
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