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A Multi-Step Transmission Electron Microscopy Sample Preparation Technique for Cracked, Heavily Damaged, Brittle Materials
Weiss Brennan, Claire V., Walck, Scott D., Swab, Jeffrey J.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927614013257
Date:
December, 2014
File:
PDF, 796 KB
english, 2014