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Tomographic Spectral Imaging with a Dual-Beam FIB/SEM: 3D Microanalysis
Kotula, Paul G., Keenan, Michael R., Michael, Joseph R.Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604880619
Date:
August, 2004
File:
PDF, 272 KB
english, 2004