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Spectrum Image Mapping with a Silicon Drift Detector (SDD) in an SEM
Newbury, D E, Small, J A, Bright, David, Iwanczyk, Jan S, Barkan, Shaul, Thiot, J FVolume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604880668
Date:
August, 2004
File:
PDF, 236 KB
english, 2004