A Standard for Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes
O'Keefe, Michael A., Allard, Lawrence F.Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604880681
Date:
August, 2004
File:
PDF, 241 KB
english, 2004