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Evidence from Simulations for Orientational Medium Range Order in Fluctuation-Electron-Microscopy Observations of a-Si
Khare, Sanjay V., Nakhmanson, Serge M., Voyles, Paul M., Keblinski, Pawel, Abelson, John R.Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604880863
Date:
August, 2004
File:
PDF, 171 KB
english, 2004