Preparation of Large Area Site Specific Plan View TEM...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

Preparation of Large Area Site Specific Plan View TEM Samples by Combining Focused Ion Beam and Etching Techniques

Anciso, A., Jones, P.J., Irwin, R.B.
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604881790
Date:
August, 2004
File:
PDF, 246 KB
english, 2004
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