![](/img/cover-not-exists.png)
Focused Ion Beam Microscopy of Oxide Dispersion Strengthened Molybdenum
Baranwal, R., Burke, M. G., Phaneuf, M. W.Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604882254
Date:
August, 2004
File:
PDF, 930 KB
english, 2004