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FIB Preparation of Samples for EBSD: Applications to Wear Studies of MEMS Materials
Michael, Joseph R, Prasad, S. V.Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604882631
Date:
August, 2004
File:
PDF, 194 KB
english, 2004