First Results from the Aberration-Corrected JEOL 2200FS-AC...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

First Results from the Aberration-Corrected JEOL 2200FS-AC STEM/TEM

Allard, Lawrence F, Blom, Douglas A, O'Keefe, Michael A, Kiely, Chris J, Ackland, D., Watanabe, M., Kawasaki, M., Kaneyama, T., Sawada, H.
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604882990
Date:
August, 2004
File:
PDF, 444 KB
english, 2004
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