![](/img/cover-not-exists.png)
Observation of Point Defect in Silicon using HRTEM
Baik, Sung Il, Chung, Hee-Suk, Zuo, Jian-Min, Kim, Young-WoonVolume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760488423x
Date:
August, 2004
File:
PDF, 690 KB
english, 2004