Observation of Metal Induced Gap States at a-Si/Al and c-Si/Al Interfaces
Schattschneider, Peter, Stoger-Pollach, MichaelVolume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604884423
Date:
August, 2004
File:
PDF, 149 KB
english, 2004