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A Wide Area Scanning Atomic Force Profiler
Batchelor, A D, Galhouse, Brian, Griffis, Dieter P, Stevie, Fred A, Russell, Phillip EVolume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604887440
Date:
August, 2004
File:
PDF, 227 KB
english, 2004