![](/img/cover-not-exists.png)
Force Fields Measured with Nanoscale Resolution Using Scanned Probe Microscopy
Eppell, Steven J, Todd, Brian AVolume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604887531
Date:
August, 2004
File:
PDF, 205 KB
english, 2004