Inelastic Mean Free Path Data for Si Corrected for Surface...

Microscopy and Microanalysis 2005 / 12 Vol. 11; Iss. 6

Inelastic Mean Free Path Data for Si Corrected for Surface Excitation

Orosz, Gábor Tamás, Gergely, György, Gurbán, Sándor, Menyhard, Miklós, Jablonski, Aleksander
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Volume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605050713
Date:
December, 2005
File:
PDF, 160 KB
english, 2005
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