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HRTEM and EELS Study in GaN-based Diluted Magnetic Semiconductor
Huang, R T, Hsu, C F, Kai, J J, Chen, F R, Chin, T SVolume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605505099
Date:
August, 2005
File:
PDF, 468 KB
english, 2005