![](/img/cover-not-exists.png)
Quantitation Procedures for Electron Probe Microanalysis of Polished Materials, Thin Films and Particles: The Past and Next Thirty Five Years
Armstrong, J TVolume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605508286
Date:
August, 2005
File:
PDF, 132 KB
english, 2005