Advantages of Cs-correctors for Spectrometry in STEM

Microscopy and Microanalysis 2005 / 8 Vol. 11; Iss. S02

Advantages of Cs-correctors for Spectrometry in STEM

Watanabe, M, Ackland, D W, Burrows, A, Kiely, C J, Williams, D B, Kanno, M, Hynes, R
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Volume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605509401
Date:
August, 2005
File:
PDF, 684 KB
english, 2005
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