High Resolution Imaging with an Aberration Corrected JEOL...

High Resolution Imaging with an Aberration Corrected JEOL 2200FS-AC STEM/TEM

Blom, D A, Allard, L F, O'Keefe, M A, Mishina, S
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Volume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760551050x
Date:
August, 2005
File:
PDF, 445 KB
english, 2005
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