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Monitoring Microstructure Evolution in TiAl Using TEM
Novoselova, T, Malinov, S, Sha, W, Rong, TSVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760606106x
Date:
August, 2006
File:
PDF, 283 KB
english, 2006