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Development of Ultra-Soft X-ray Spectrometer for Electron Probe Microanalysis
Fukushima, S, Kimura, T, Ogiwara, T, Tsukamoto, K, Tazawa, T, Tanuma, SVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606062441
Date:
August, 2006
File:
PDF, 250 KB
english, 2006