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Secondary Electron Generation by Low Energy Ion Beams
Joy, D, Lin, Y, Meyers, H, Demers, H, Newbury, DVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606062751
Date:
August, 2006
File:
PDF, 156 KB
english, 2006