Preparation of Site Specific Atom Probe Tips using Focused...

Preparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology

McGrouther, D, McKenzie, W, Saxey, D, Cairney, JM, Marceau, R, Ringer, SP, Munroe, PR
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606062866
Date:
August, 2006
File:
PDF, 388 KB
english, 2006
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