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Preparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology
McGrouther, D, McKenzie, W, Saxey, D, Cairney, JM, Marceau, R, Ringer, SP, Munroe, PRVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606062866
Date:
August, 2006
File:
PDF, 388 KB
english, 2006