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Confocal Raman AFM, a powerful tool for the nondestructive characterization of heterogeneous materials
Schmidt, U, Vargas, F, Kress, M, Weishaupt, K, Hollricher, OVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760606315x
Date:
August, 2006
File:
PDF, 969 KB
english, 2006