![](/img/cover-not-exists.png)
Future Trends for Quantitative X-Ray Microanalysis is a Field Emission Scanning Electron Microscope at Low Beam Energies
Gauvin, RVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606063458
Date:
August, 2006
File:
PDF, 178 KB
english, 2006