Electron Tomographic Characterization of ErSi2 and GexSi1-x...

Electron Tomographic Characterization of ErSi2 and GexSi1-x Nanoparticles Prepared by Doping of 4H-SiC

Kuebel, C, Kaiser, U
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606064932
Date:
August, 2006
File:
PDF, 636 KB
english, 2006
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