A New Era of Analysis with Spherical-Abervation Corrected...

A New Era of Analysis with Spherical-Abervation Corrected STEM - Atomic and Electronic Information Approaching the Single Atom Level

Stam, M Van der, Erni, R, Kujawa, S, Tiemeijer, P, Stekelenburg, M, Freitag, B
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606065615
Date:
August, 2006
File:
PDF, 253 KB
english, 2006
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