A New Era of Analysis with Spherical-Abervation Corrected STEM - Atomic and Electronic Information Approaching the Single Atom Level
Stam, M Van der, Erni, R, Kujawa, S, Tiemeijer, P, Stekelenburg, M, Freitag, BVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606065615
Date:
August, 2006
File:
PDF, 253 KB
english, 2006