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High Resolution TEM at 80kV Acceleration Voltage – Is Approaching 1 Ångström Possible?
Kujawa, S, Erni, R, Freitag, B, Tiemeijer, P, Stekelenburg, MVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760606572x
Date:
August, 2006
File:
PDF, 407 KB
english, 2006