Instrumentation Developments in Atom Probe Tomography:...

Instrumentation Developments in Atom Probe Tomography: Applications in Semiconductor Research

Bunton, J, Lenz, D, Olson, J, Thompson, K, Ulfig, R, Larson, D, Kelly, T
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Volume:
12
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606065809
Date:
August, 2006
File:
PDF, 689 KB
2006
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