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An Optimized Solution for Cryo Electron Tomography
Voorhout, W, Haas, F De, Frederik, P, Schoenmakers, R, Busing, W, Hubert, DVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606065822
Date:
August, 2006
File:
PDF, 158 KB
english, 2006