3D Imaging with Single Atom Sensitivity using Confocal STEM

Microscopy and Microanalysis 2006 / 8 Vol. 12; Iss. S02

3D Imaging with Single Atom Sensitivity using Confocal STEM

Benthem, K van, Jonge, N de, Borisevich, AY, Oxley, MP, Pennycook, SJ
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606066700
Date:
August, 2006
File:
PDF, 340 KB
english, 2006
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