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Characterization of Gold on Silicon Nanowires using Aberration-corrected STEM
Oh, SH, Benthem, K van, Molina, SI, Werner, P, Kumar, D, Pennycook, SVolume:
13
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927607076684
Date:
August, 2007
File:
PDF, 735 KB
english, 2007