Analysis of Bulk Dielectrics with Atom Probe Tomography
Larson, DJ, Alvis, RL, Lawrence, DF, Prosa, TJ, Ulfig, RM, Reinhard, DA, Clifton, PH, Gerstl, SSA, Bunton, JH, Lenz, DR, Kelly, TF, Stiller, KVolume:
14
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927608083657
Date:
August, 2008
File:
PDF, 93 KB
english, 2008