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Molecular Depth Profiling to 3D Molecular Imaging with XPS and TOF-SIMS
Hammond, JS, Fisher, GL, Raman, S, Moulder, JFVolume:
14
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927608085528
Date:
August, 2008
File:
PDF, 105 KB
english, 2008