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Can X-ray Spectrum Imaging (XSI) Replace Backscattered Electron (BSE) Imaging for Compositional Contrast in the Scanning Electron Microscope?
Newbury, DEVolume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609092125
Date:
July, 2009
File:
PDF, 904 KB
2009